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Onto PrimaScan Wafer Defect Inspection System Semiconductor Metrology Equipment Pattern Inspection

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$264.20
Minimum order quantity: 5,000 pieces
Specification

Key attributes

Flaw Detection Video

Yes

Origin

america

Processing customization

no

Part Number

1

Imported or not

no

Specification

other

Shipping
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Key attributes

Flaw Detection Video
Yes
Origin
america
Processing customization
no
Part Number
1
Imported or not
no
Specification
other
model
PrimaScan
Scope of application
widely
brand
Onto
Order Number
1

Packaging and delivery

Selling Units
Single item

Product descriptions from the supplier